JJ X-ray Products

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JJ X-ray offers a wide range of spectacular and efficient components and solutions, where cutting-edge technology meets precision. Elevate your research with our advanced solutions, designed to unlock new possibilities in scientific discovery. Welcome to the forefront of innovation.
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Slit Systems (X-rays / Neutrons)

Over the last 25 years, JJ X-Ray has designed a large portfolio of slit systems used at x-ray and neutron facilities all over the world. Our top priority is to give the customer the best solution whether they need the slit system to be standard, modified or customized.

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Slit Systems (X-rays / Neutrons)

Analyzer / Spectrometers

For more information, please visit the Spectrum Analyzer and Spectrometer product categories. 

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Analyzer / Spectrometers

Attenuators

The Solid Attenuator Assembly was originally designed to precisely attenuate the XFEL beam intensity in several different circumstances: In cases where the full intensity would be harmful, or would create thermal distortions on downstream x-ray optical devices, and to adjust the beam intensity delivered to the sample for fluence or intensity-dependent experiments.

For more information, please visit the Attenuator product categories.

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Attenuators

Beam Diagnostics

JJ X-Ray offers a range of cutting-edge products designed to enhance the precision and reliability of X-ray analysis systems. Diagnostic and analytic tools are essential for accurately measuring and analyzing X-ray beams, ensuring optimal performance across a variety of applications.

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Beam Diagnostics

Collimators (X-rays / Neutrons)

All collimators are based on a custom design and are divided into three categories defined by the orientation of the foils.

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Collimators (X-rays / Neutrons)

Control Systems

JJ X-Ray provides comprehensive PLC solutions designed to enhance the integration and functionality beamline equipment. Our expertise in motion control and programmable logic controllers (PLCs) enables us to develop tailored automation systems that meet the specific demands in terms of precision and safety of scientific instrumentation in research environments.

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Control Systems

Custom Solutions

When working on complex or custom projects, we always work in close collaboration with the customer to make sure all requirements are met, and projects are executed in a timely manner.

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Custom Solutions

Diamond Lenses

Single crystal diamond lenses are claiming an increasing share of the market for synchrotron optics. Especially for applications with high energies and where coherence preservation is important, their high thermal stability and conductivity as well as their low background scattering have been proven to be important assets. 

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Diamond Lenses

Full Beamlines

At JJ X-Ray, we have a long history of designing and producing various types of beamline components as well as complete solutions for our customers.

A typical beamline consists of different types of optics, monochromators, attenuators, beam diagnostics, and beam defining slits. For a beamline solution, these diverse types of components need to be intelligently designed and integrated to provide the optimal x-ray or neutron beam for your desired experiment.

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Full Beamlines

Fixed Masks

The white beam mask can be used in the front end or as a cost effective alternative to the white beam synchrotron slit. The white beam mask consists of two Cu alloy blocks with tapered square cutouts that can be moved vertically and latteraly such that each of the blocks from one-half of the vertical and one-half of the horizontal beam definition (like two L’s opposing each other).

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Fixed Masks

Monochromators

JJ X-Ray A/S provides a range of monochromators designed for precise control of X-ray wavelengths in various research and industrial applications. Monochromators are essential for selecting specific wavelengths from an X-ray beam, improving the quality and resolution of diffraction and spectroscopy measurements.

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Monochromators

Mirror Systems

The precision and accuracy with which X-ray focusing mirrors are positioned are crucial to all experiments on the beamline. The mirror positioning system needs to reflect the relevant photon beam from the storage ring without the interference of vibrations from the environment. Selection of the desired beam redirection requires submicron size linear translations as well as pitch, roll and yaw motions in the microradian range.

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Mirror Systems

CRLS / Transfocators

A transfocator is a versatile X-ray optical device that uses compound refractive lenses (CRLs) to focus or collimate X-ray beams. By inserting different combinations of lens cartridges into the beam path, the total number of lenses—and thus the focal length—can be precisely controlled. This allows quick adjustment for different beam energies, spot sizes, and working distances. Designed for use in air or vacuum, transfocators are ideal for synchrotron and laboratory applications, offering stable, compact, and tunable X-ray beam focusing.

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CRLS / Transfocators

Positioning Systems (X-rays / Neutrons)

JJ X-Ray offers an extensive selection of positioning systems, designed for exact motion and endurance with a focus on scientific sector. Achieving groundbreaking results hinges on precise control, and our systems deliver reliable, repeatable motions for a variety of applications.

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Positioning Systems (X-rays / Neutrons)

Shutters and Stoppers

To be updated

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Shutters and Stoppers
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Soft X-ray Reflectometer

The reflectometer, enclosed within a 1.3 m3 vacuum vessel, is equipped with two interchangeable x-ray sources, one with an Al target and the other with a Cu target. The operational vacuum 1e-5 mbar is reached with a pump-down time of 4 hours; the ultimate pressure is 5e-8 mbar.

The versatile KB system delivers a high direct beam intensity with Zeiss optics, which provides a parallel beam 2.5 mm high and 0.5 mm wide for both sources. The KB optics system is optimized for Cu Kα Bragg reflection and Al Kα total external reflection, so the Al source requires the use of a flat multilayer monochromator. The source and collimating mirrors can be sealed off from the main vessel vacuum, such that the sources may be interchanged with practically no additional pump time.

A multi-sample holder situated on an x-y-z linear stage makes it straight forward to characterize many samples without breaking the vacuum.

The encoded theta and 2-theta goniometers provide the user with a wide range of scattering angles with a high resolution. For Al Kα, the range of scattering angles 2Θ extends from 0 to 35˚, whereas for the Cu Kα radiation, the 2Θ range extends from 0 to 20˚.

The 2D detector is optimized for the detection of low energy photons, providing the capability of 6 orders of magnitude detection for both sources within 10 s integration time. The detector’s active area is 26.6 mm wide and 6.7 mm high.

The vessel is equipped with four large viewports, which provide an excellent overview of the system during operation. The custom Al target source and collimating KB mirror setup are developed together with AXO DRESDEN GmbH.

Publications about and with this instrument.
Henriksen, P. L. et al. LEXR: A low-energy X-ray reflectometer for characterization of ATHENA mirror coatings. in Optics for EUV, X-Ray, and Gamma-Ray Astronomy IX vol. 11119 111191F (International Society for Optics and Photonics, 2019). https://doi.org/10.1117/12.2528144

Henriksen, P. L. et al. Qualification and performance of the Low-Energy X-ray Reflectometer (LEXR). in Space Telescopes and Instrumentation 2020: Ultraviolet to Gamma Ray vol. 11444 114444J (International Society for Optics and Photonics, 2020). https://doi.org/10.1117/12.2562242

Svendsen, S. et al. Performance and time stability of Ir/SiC X-ray mirror coatings for ATHENA. in Optics for EUV, X-Ray, and Gamma-Ray Astronomy IX vol. 11119 111190G (International Society for Optics and Photonics, 2019). https://doi.org/10.1117/12.2528664

Jafari, A. et al. X-ray reflectometry of a platinum coating as reference sample for the ATHENA coating development. in Optics for EUV, X-Ray, and Gamma-Ray Astronomy IX vol. 11119 111191K (International Society for Optics and Photonics, 2019). https://doi.org/10.1117/12.2527557

Technical Specifications

For more technical details, please contact us.

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