JJ X-ray Products
Explore our innovative products and technologies
Slit Systems
Over the last 25 years, JJ X-Ray has designed a large portfolio of slit systems used at x-ray and neutron facilities all over the world. Our top priority is to give the customer the best solution whether they need the slit system to be standard, modified or customized.
Collimators
All collimators are based on a custom design and are divided into three categories defined by the orientation of the foils.
Optics
JJ X-Ray A/S supplies high-precision refractive and reflective optics for synchrotron applications. Their refractive optics include SCD CRLs and lenses in beryllium, aluminum, and nickel for beam focusing. Reflective optics feature customizable mirror systems suitable for UHV/XHV environments, offering options like bending, cooling, and heating for enhanced stability and performance.
Monochromators
JJ X-Ray A/S provides a range of monochromators designed for precise control of X-ray wavelengths in various research and industrial applications. Monochromators are essential for selecting specific wavelengths from an X-ray beam, improving the quality and resolution of diffraction and spectroscopy measurements.
Diagnostics and Analysis
JJ X-Ray offers a range of cutting-edge products designed to enhance the precision and reliability of X-ray analysis systems. Diagnostic and analytic tools are essential for accurately measuring and analyzing X-ray beams, ensuring optimal performance across a variety of applications.
Positioning Systems
JJ X-Ray offers an extensive selection of positioning systems, designed for exact motion and endurance with a focus on scientific sector. Achieving groundbreaking results hinges on precise control, and our systems deliver reliable, repeatable motions for a variety of applications.
Custom Solutions
When working on complex or custom projects, we always work in close collaboration with the customer to make sure all requirements are met, and projects are executed in a timely manner.
Full Beamlines
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Soft X-ray Reflectometer
The reflectometer, enclosed within a 1.3 m3 vacuum vessel, is equipped with two interchangeable x-ray sources, one with an Al target and the other with a Cu target. The operational vacuum 1e-5 mbar is reached with a pump-down time of 4 hours; the ultimate pressure is 5e-8 mbar.
The versatile KB system delivers a high direct beam intensity with Zeiss optics, which provides a parallel beam 2.5 mm high and 0.5 mm wide for both sources. The KB optics system is optimized for Cu Kα Bragg reflection and Al Kα total external reflection, so the Al source requires the use of a flat multilayer monochromator. The source and collimating mirrors can be sealed off from the main vessel vacuum, such that the sources may be interchanged with practically no additional pump time.
A multi-sample holder situated on an x-y-z linear stage makes it straight forward to characterize many samples without breaking the vacuum.
The encoded theta and 2-theta goniometers provide the user with a wide range of scattering angles with a high resolution. For Al Kα, the range of scattering angles 2Θ extends from 0 to 35˚, whereas for the Cu Kα radiation, the 2Θ range extends from 0 to 20˚.
The 2D detector is optimized for the detection of low energy photons, providing the capability of 6 orders of magnitude detection for both sources within 10 s integration time. The detector’s active area is 26.6 mm wide and 6.7 mm high.
The vessel is equipped with four large viewports, which provide an excellent overview of the system during operation. The custom Al target source and collimating KB mirror setup are developed together with AXO DRESDEN GmbH.
Publications about and with this instrument.
Henriksen, P. L. et al. LEXR: A low-energy X-ray reflectometer for characterization of ATHENA mirror coatings. in Optics for EUV, X-Ray, and Gamma-Ray Astronomy IX vol. 11119 111191F (International Society for Optics and Photonics, 2019). https://doi.org/10.1117/12.2528144
Henriksen, P. L. et al. Qualification and performance of the Low-Energy X-ray Reflectometer (LEXR). in Space Telescopes and Instrumentation 2020: Ultraviolet to Gamma Ray vol. 11444 114444J (International Society for Optics and Photonics, 2020). https://doi.org/10.1117/12.2562242
Svendsen, S. et al. Performance and time stability of Ir/SiC X-ray mirror coatings for ATHENA. in Optics for EUV, X-Ray, and Gamma-Ray Astronomy IX vol. 11119 111190G (International Society for Optics and Photonics, 2019). https://doi.org/10.1117/12.2528664
Jafari, A. et al. X-ray reflectometry of a platinum coating as reference sample for the ATHENA coating development. in Optics for EUV, X-Ray, and Gamma-Ray Astronomy IX vol. 11119 111191K (International Society for Optics and Photonics, 2019). https://doi.org/10.1117/12.2527557
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Technical Specifications
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